X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.7 291 20MM SODIUM PHOSPHATE, 100-200MM NACL, 0.6% BOG, 1MM NSAID AGAINST RESERVOIR OF 4-8% PEG-4000, pH 6.7, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 98.931 Å b: 206.550 Å c: 221.553 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 2 2 2
Crystal Properties:
Matthew's Coefficient: 4.44 Solvent Content: 72.28
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.000 43.330 151982 11371 99.700 ? 0.237 32.800
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 50 99.9 0.087 ? 7.1 5.6 152014 151982 0 0 26.300
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2 2.13 100 ? ? 2.4 5.6 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 180 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X25 1.099 NSLS X25
Software
Software Name Purpose Version
CNS refinement 1.1
PDB_EXTRACT data extraction 1.700
ADSC data collection .
d*TREK data scaling .
CNS phasing .
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