X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 173 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| SYNCHROTRON | ALS BEAMLINE 4.2.2 | 0.987121, 0.979553, 0.979144 | ALS | 4.2.2 |
| Software Name | Purpose | Version |
|---|---|---|
| d*TREK | data scaling | 9.2LDz |
| SOLVE | phasing | 2.06 |
| RESOLVE | phasing | 2.06 |
| REFMAC | refinement | . |
| PDB_EXTRACT | data extraction | 1.700 |
| Blu-Ice | data collection | . |
