X-RAY DIFFRACTION
Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
---|---|---|---|---|---|---|---|---|
1 | 100.0 K |
Source | Type | Wavelength List | Synchrotron Site | Beamline |
---|---|---|---|---|
ROTATING ANODE | RIGAKU RUH3R | 1.5418 | ? | ? |
Software Name | Purpose | Version |
---|---|---|
d*TREK | data scaling | 9.2D |
PHASER | phasing | . |
REFMAC | refinement | . |
PDB_EXTRACT | data extraction | 1.700 |
CrystalClear | data reduction | D*TREK (MSC/RIGAKU) |
CCP4 | data scaling | (TRUNCATE) |
ARP/wARP | model building | . |
XTALVIEW | refinement | . |