X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 291 5% PEG 8000, 200mM KCl, 40mM bis-tris-propane pH 8.5, 2.5% 1,2-propanediol, 0.5% n-heptyl-B-D-glucopyranoside, 1mM EDTA, 10mM DTT, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 37.220 Å b: 96.717 Å c: 92.304 Å α: 90.00° β: 89.96° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.5 Solvent Content: 50.8
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.000 43.030 42892 2163 97.110 0.238 0.259 34.880
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.11 96.22 ? ? ? ? 6119
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 65 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-4 0.939261 ESRF ID14-4
Software
Software Name Purpose Version
SCALA data scaling CCP4_3.1.9
MOLREP phasing .
REFMAC refinement 5.2.0005
PDB_EXTRACT data extraction 1.700
MOSFLM data reduction .
CCP4 data scaling (SCALA)