X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.9 278 Peg 4000, Hepes buffer, isopropanol, pH 7.9, VAPOR DIFFUSION, HANGING DROP, temperature 278K
Unit Cell:
a: 41.490 Å b: 48.390 Å c: 55.590 Å α: 76.16° β: 87.70° γ: 87.54°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.04 Solvent Content: 52.1
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.20 19.87 16410 1377 77.2 0.243 0.334 41.1
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.0 30. 66.6 0.082 ? 9.9 1.7 28299 18838 1.0 1.0 26.7
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.0 2.07 26. ? ? 1.7 1.1 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 123 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 0.92015 APS 22-ID
Software
Software Name Purpose Version
CNS refinement 1.0
HKL-2000 data reduction .
CCP4 data scaling (TRUNCATE)
CNS phasing .