X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 277 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| ROTATING ANODE | SIEMENS | ? | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| DM | model building | . |
| MLPHARE | phasing | . |
| TNT | refinement | 5E |
| MARXDS | data reduction | . |
| MARSCALE | data scaling | . |
| DM | phasing | . |
