X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 303 25% MPD, 200 mM KCl, 5 mM SrCl2, 50 mM MES pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 303K
Unit Cell:
a: 179.277 Å b: 85.231 Å c: 101.912 Å α: 90.00° β: 96.83° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 3.4 Solvent Content: 60
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? THROUGHOUT 3.85 8 12652 602 97.5 0.356 0.3617 81.165
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.85 21.05 97.200 0.06 0.06 11.500 2.700 14328 13927 1.0 1.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.85 3.95 98.9 98.900 0.231 2.800 2.600 1046
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 5ID-B ? APS 5ID-B
Software
Software Name Purpose Version
SCALA data scaling .
PHASER phasing .
SHARP phasing .
SOLOMON phasing .
CNS refinement .
PDB_EXTRACT data extraction 1.601
CCP4 data scaling (SCALA)
Feedback Form
Name
Email
Institute
Feedback