X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.1 291 MES, PEG 4000, 2-propanol, EDTA, NaN3, 2-mercaptoethanol, pH 6.1, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 66.991 Å b: 66.991 Å c: 47.011 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 43
Crystal Properties:
Matthew's Coefficient: 2.02 Solvent Content: 39.25
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.80 30.0 18828 1851 96.6 0.2240000 0.2437000 36.4
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 99.0 96.5 ? 0.0390000 48.5 9.0 19521 19521 0.0 0.0 28.553
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.80 1.86 92.0 ? 0.1950000 5.2 3.1 1799
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 90 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 14-BM-D 1.00 APS 14-BM-D
Software
Software Name Purpose Version
CNS refinement .
DENZO data reduction .
SCALEPACK data scaling .
CNS phasing .