X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.1 ? 4 MICROLITERS OF 8.7 MG/ML MAB 61.1.3, 2 MICROLITERS OF 50 MILLIMOLAR SODIUM CITRATE PH 5, 1 MICROLITER OF N-TRIDECYL-B-D-MALTOSIDE, AND 5 MICROLITERS OF 12% PEG 3350 EQUILIBRATED AGAINST 700 MICROLITERS OF 12% PEG 3350, AT ROOM TEMPERATURE (CRYSCHEM PLATE)., pH 5.1
Unit Cell:
a: 66.650 Å b: 190.660 Å c: 73.100 Å α: 90.00° β: 109.66° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 3.0 Solvent Content: 59.
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.20 20.00 21145 2064 75.0 0.211 0.327 57.1
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.2 99.0 95.6 0.145 ? 6.4 3.3 ? 27971 ? ? 45.2
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 291 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X12C ? NSLS X12C
Software
Software Name Purpose Version
DENZO data reduction .
SCALEPACK data scaling .
X-PLOR model building 3.8
X-PLOR refinement 3.8
X-PLOR phasing 3.8
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