X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 301.5 PEG 10000, HEPES-HCl, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 301.5K
Unit Cell:
a: 33.577 Å b: 38.881 Å c: 54.936 Å α: 83.32° β: 80.14° γ: 74.72°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.02 Solvent Content: 60.0
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.85 19.83 22327 1078 99.5 0.222 0.247 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.825 20 94.8 0.088 ? 15 3.520 188639 23155 0 0 23.5
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.825 2.0 87.1 ? ? ? 3.41 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON MAX II BEAMLINE I711 1.009 MAX II I711
Software
Software Name Purpose Version
XDS data scaling .
XDS data reduction .
CNS refinement .
CNS phasing .