X-RAY DIFFRACTION
Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
---|---|---|---|---|---|---|---|---|
1 | 298 K |
Source | Type | Wavelength List | Synchrotron Site | Beamline |
---|---|---|---|---|
ROTATING ANODE | RIGAKU RUH2R | ? | ? | ? |
Software Name | Purpose | Version |
---|---|---|
R-AXIS | data collection | SOFTWARE |
R-AXIS | data reduction | SOFTWARE |
TNT | refinement | 5E |
R-AXIS | data scaling | . |