X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 298 PEG 5k MME, Na Acetate, ethylene glycol, sucrose, glycerol, pH 5.6, VAPOR DIFFUSION, temperature 298K
Unit Cell:
a: 160.045 Å b: 160.045 Å c: 160.045 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 43 3 2
Crystal Properties:
Matthew's Coefficient: 4.5 Solvent Content: 66.1
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.30 37.72 30005 1593 99.89 0.16383 0.19081 32.343
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 37.72 99.9 ? 0.072 9.1 9.4 31599 31599 0 0 45.8
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.3 2.38 97.8 ? 0.446 4.3 8.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 105 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97930 APS 19-ID
Software
Software Name Purpose Version
REFMAC refinement 5.2.0005
SBC-Collect data collection .
HKL-2000 data scaling .
HKL-3000 phasing .
SHELXD phasing .
SHELXE model building .
MLPHARE phasing .
DM phasing .
SOLVE phasing .
RESOLVE phasing .
O model building .
Coot model building .
CCP4 phasing .
ARP/wARP model building .