X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.8 298.0 PEG 8000, sodium citrate, sodium dihydrogen phosphate, sodium chloride, pH 4.8, VAPOR DIFFUSION, HANGING DROP, temperature 298.0K
Unit Cell:
a: 66.860 Å b: 66.860 Å c: 180.848 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 31 2 1
Crystal Properties:
Matthew's Coefficient: 3.4 Solvent Content: 59.0
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SIRAS THROUGHOUT 1.900 30.670 35586 1888 100.000 0.203 0.233 29.572
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.90 30.68 99.400 0.063 0.063 18.8 5.700 ? 37481 0 0 27.0
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.90 2.00 100 100.000 0.263 2.700 5.500 5409
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SRS BEAMLINE PX14.1 1.4880 SRS PX14.1
Software
Software Name Purpose Version
SCALA data scaling .
SOLVE phasing 2.06
RESOLVE phasing 2.06
REFMAC refinement .
PDB_EXTRACT data extraction 1.601
MOSFLM data reduction .
CCP4 data scaling (SCALA)
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