X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 105 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| SYNCHROTRON | APS BEAMLINE 19-BM | 0.97945, 0.97929, 0.96411 | APS | 19-BM |
| Software Name | Purpose | Version |
|---|---|---|
| REFMAC | refinement | 5.2.0005 |
| d*TREK | data reduction | . |
| HKL-2000 | data scaling | . |
| SOLVE | phasing | . |
| RESOLVE | phasing | . |
| ARP/wARP | model building | . |
