X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.20 ? 0.1 M MES (PH 7.2), 1.8 M AMMONIUM SULFATE, 10 MM COCL2, pH 7.20
Unit Cell:
a: 151.480 Å b: 151.480 Å c: 101.680 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 4 2 2
Crystal Properties:
Matthew's Coefficient: 2.74 Solvent Content: 49.0000
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.900 6.000 39729 3980 88.200 ? 0.2630000 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.900 40.000 96.500 0.0680000 ? 6.0000 6.200 ? 44921 ? 0.000 21.90
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.900 1.970 87.60 ? ? 2.500 3.000 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 110.00 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9791,1.0781 APS 19-ID
Software
Software Name Purpose Version
CNS refinement .
CCP4 model building .
HKL-2000 data reduction .
DENZO data reduction .
HKL-2000 data scaling .
SCALEPACK data scaling .
CNS phasing .
CCP4 phasing .