X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 292 Tris-HCl, LiSO4, PEG-4000, glycerol, MgCl2, AlCl2, NaF, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 292K
Unit Cell:
a: 74.077 Å b: 74.077 Å c: 344.381 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 32 1 2
Crystal Properties:
Matthew's Coefficient: 2.55 Solvent Content: 52
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.00 30.00 69172 3678 98.70 0.18092 0.20801 16.549
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.0 30 98.7 ? 0.06 20.1 4.0 72958 72958 1 1 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.07 98.9 ? 0.232 4.2 3.5 7206
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.3.1 1.116 ALS 8.3.1
Software
Software Name Purpose Version
REFMAC refinement 5.1.24
HKL-2000 data reduction .
SCALEPACK data scaling .
AMoRE phasing .
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