X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.2 293 10% PEG 8000, 0.2 M NaCl, sodium/potassium phosphate buffer, pH 6.2, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 79.285 Å b: 79.285 Å c: 105.115 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 43 21 2
Crystal Properties:
Matthew's Coefficient: 2.8 Solvent Content: 56.0
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 2.35 40.00 14465 1450 99.80 0.1998 0.2439 46.014
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.35 40 99.4 0.136 ? 41.2 22.7 14552 14468 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.35 2.41 99.6 ? ? 4.10 18.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9791 APS 19-ID
Software
Software Name Purpose Version
REFMAC refinement 5.2.0005
HKL-2000 data reduction .
SCALEPACK data scaling .
SHELXD phasing .
SOLVE phasing .
RESOLVE phasing .