X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.00 301.00 pH 6.00, VAPOR DIFFUSION, temperature 301.00K
Unit Cell:
a: 113.720 Å b: 113.720 Å c: 136.541 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 64 2 2
Crystal Properties:
Matthew's Coefficient: 5.16 Solvent Content: 82.0000
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIR NONE 3.000 10.000 ? ? 81.700 ? ? 33.00
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.000 20.000 95.000 ? 0.0800000 15.7000 ? ? 10688 ? 0.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.000 3.140 98.80 0.4950000 2.240 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 278.00 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL ? SSRL ?
Software
Software Name Purpose Version
PHARE model building .
DENMOD model building .
NUCLIN/PROFFT refinement .
MODIFIED refinement BY Z.OTWINOWSKI
DENZO data reduction .
SCALEPACK data scaling .
MLPHARE phasing .
DM phasing .
NUCLIN refinement .
PROFFT refinement (MODIFIED BY Z.OTWINOWSKI)