X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.20 293 50 mM Na acetate pH 5.2; 14% w/v PEG 3350, pH 5.20, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 93.884 Å b: 92.835 Å c: 49.435 Å α: 90.00° β: 90.66° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.3 Solvent Content: 45.7
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ISOMORPHOUS REPLACEMENT THROUGHOUT 1.95 33.84 56381 3009 96.08 0.18257 0.23243 24.842
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.950 50.000 95.9 0.044 ? 21.3339 2.8 60260 60260 0 -3.000 31.8
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.95 2.02 91.0 ? ? 3.077 2.70 5679
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 1.03106 APS 19-BM
Software
Software Name Purpose Version
HKL-2000 data collection .
HKL-2000 data reduction .
REFMAC refinement 5.2.0005
HKL-2000 data reduction .
HKL-2000 data scaling .
CNS phasing .
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