X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.4 292 11% (w/v) PEG 3350, 0.1M Na Citrate, 0.2M (NH4)2 Sulfate, pH 5.4, VAPOR DIFFUSION, HANGING DROP, temperature 292K
Unit Cell:
a: 56.128 Å b: 56.128 Å c: 154.423 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 32 2 1
Crystal Properties:
Matthew's Coefficient: 2.2 Solvent Content: 43.5
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION rigid body refinement of 1U1V THROUGHOUT 1.30 19.10 61287 3287 91.77 0.13482 0.15973 24.128
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.3 20.0 91.7 ? 0.051 15.2 5.0 70364 63575 ? -3.0 32
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.3 1.4 69.5 ? 0.229 4.6 3.0 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-4 1.007 ESRF ID14-4
Software
Software Name Purpose Version
REFMAC refinement 5.1.19
XDS data reduction .
XDS data scaling .