X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7 295 PEG MME 5000, lithium sulfate, nonyl-D-glucoside, pH 7, VAPOR DIFFUSION, HANGING DROP, temperature 295K
Unit Cell:
a: 59.205 Å b: 109.791 Å c: 91.605 Å α: 90.00° β: 106.13° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.4 Solvent Content: 48
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION rigid body refinement ? 1.75 69 110719 11084 97.9 0.209 0.234 21.6
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.75 69.0 98.0 ? 0.07 6.0 4.2 110879 110752 2.0 2.0 20.4
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.75 1.84 98 ? 0.26 2.7 3.3 15867
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.9794 SLS X06SA
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling .
CNS refinement .
CCP4 data scaling (SCALA)
CNS phasing .