X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 285 Tris/HCl, Zn-acetate, ethylene glycol, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 285K
Unit Cell:
a: 76.397 Å b: 61.415 Å c: 50.798 Å α: 90.00° β: 129.71° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.5 Solvent Content: 51.3
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.80 39.2 15558 839 97.50 0.19277 0.2542 33.444
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 39.2 97.88 ? 0.069 5.0843 2.1 16420 16397 6.0 6.0 24.60
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.8 1.9 98.77 ? 0.25 2.54 2.1 2403
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.97960, 0.97888, 0.88556, 0.97912 SLS X06SA
Software
Software Name Purpose Version
REFMAC refinement 5.2.0003
MOSFLM data reduction .
CCP4 data scaling (SCALA)
SHARP phasing .
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