ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7	294	22.5 % (w/v) PEG 8000, 0.1 M Tris-Cl (pH 7.0), 0.2 M Sodium acetate, VAPOR DIFFUSION, temperature 294K

Unit Cell:

a: 70.844 Å b: 83.167 Å c: 89.941 Å α: 100.39° β: 110.01° γ: 100.03°

Symmetry:

Space Group: P 1

Crystal Properties:

Matthew's Coefficient: 2.6 Solvent Content: 52.7

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MAD	THROUGHOUT	1.85	48.54	149432	14911	95.3	?	0.215	20.2

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.85	50	93.2	?	0.061	11.2	1.8	?	149486	0	0	14.8

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.85	1.92	63.8	?	0.324	2.5	1.7	20086

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	NSLS BEAMLINE X8C	0.9802, 0.9792, 0.964	NSLS	X8C

Software