X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 100.0 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| ROTATING ANODE | ? | ? | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| CLYSTAL | data collection | CLEAR VER1.35 |
| CLYSTAL | data reduction | CLEAR VER1.35 |
| ARP/wARP | model building | . |
| REFMAC | refinement | . |
| CrystalClear | data reduction | V. 1.35 (MSC/RIGAKU) |
| CrystalClear | data scaling | V. 1.35 (MSC/RIGAKU) |
| ACORN | phasing | . |
