X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8 277 PEG8000, DMSO, MgAMPPNP, galactose, NaCl, HEPPS, batch, temperature 277K
Unit Cell:
a: 73.200 Å b: 109.600 Å c: 115.800 Å α: 90.00° β: 95.90° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.7 Solvent Content: 54
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD ? 2.5 20.0 61550 6099 95.2 0.205 0.258 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.50 30.0 93.7 ? 0.054 21.5 3.3 61550 61550 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.50 2.60 94.0 ? 0.126 4.9 2.4 7461
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 32-ID 0.97916, 0.97931, 0.96408, 0.97000 APS 32-ID
Software
Software Name Purpose Version
MOSFLM data reduction .
HKL-2000 data reduction .
SOLVE phasing .
TNT refinement .
HKL-2000 data scaling .