X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 293 100mM Na citrate (pH 5.6), 100mM MgCl2, 30% MPD, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 60.720 Å b: 75.442 Å c: 30.781 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 2
Crystal Properties:
Matthew's Coefficient: 2.0 Solvent Content: 37.9
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.00 40.00 9346 493 97.70 0.21575 0.27012 31.998
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 50.000 99.7 0.044 ? 24.9 6.7 10096 10096 1 -3.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.07 100.0 ? ? 5.5 5.9 683
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X9B 0.97946, 0.97915, 0.96422 NSLS X9B
Software
Software Name Purpose Version
HKL-2000 data collection .
HKL-2000 data reduction .
SHELXD phasing .
SOLVE phasing .
RESOLVE model building .
REFMAC refinement 5.1.24
HKL-2000 data scaling .
SHARP phasing .
RESOLVE phasing .