X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.80 298 PEG 4000, Ammonium acetate, Sodium citrate, pH 5.8, VAPOR DIFFUSION, SITTING DROP, temperature 298K, pH 5.80
Unit Cell:
a: 59.590 Å b: 72.640 Å c: 80.350 Å α: 99.00° β: 107.09° γ: 102.02°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.20 Solvent Content: 61.00
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD ? 2.40 50.00 44190 1335 92.3 0.226 0.239 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.400 50.000 98.4 ? 0.076 8.2000 3.800 47252 47252 ? 0.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.40 2.49 96.2 ? ? ? ? 4645
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X25 0.97920, 0.97940, 0.95000 NSLS X25
Software
Software Name Purpose Version
CBASS data collection .
HKL-2000 data reduction .
SOLVE phasing & SHARP
CNS refinement 1.1
HKL-2000 data scaling .
SHARP phasing .
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