X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.8 277 1.0M sodium citrate, 0.1M Tris pH 7.0, 0.2M NaCl, pH 7.8, VAPOR DIFFUSION,SITTING DROP,NANODROP, temperature 277K
Unit Cell:
a: 50.891 Å b: 50.891 Å c: 121.430 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 43 21 2
Crystal Properties:
Matthew's Coefficient: 1.87 Solvent Content: 33.73
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.62 46.94 19865 1077 99.15 0.146 0.16673 17.787
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.620 60.72 99.4 ? 0.059 19.3 7.7 ? 20981 ? ? 25.41
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.62 1.66 98.6 ? 0.562 3.7 7.9 1498
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.2 1.0000, 0.9796, 0.9794 ALS 8.2.2
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling 4.2)
SOLVE phasing .
RESOLVE model building .
REFMAC refinement 5.2.0000
CCP4 data scaling (SCALA)
RESOLVE phasing .
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