X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.2 278.0 ammonium sulfate, pH 5.2, VAPOR DIFFUSION, SITTING DROP, temperature 278.0K
Unit Cell:
a: 102.300 Å b: 102.300 Å c: 112.300 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 6 2 2
Crystal Properties:
Matthew's Coefficient: 2.89 Solvent Content: 57.13
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.4 50.0 12844 641 ? ? 0.3325 66.4738
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.4 50. 99.8 ? 0.066 5.3 5.7 13880 13880 0.0 0.0 50.406
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.4 2.53 99.8 ? 0.492 1.5 5.8 1986
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SPRING-8 BEAMLINE BL40B2 1.0 SPring-8 BL40B2
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling .
XTALVIEW refinement .
CNS refinement 1.0
CCP4 data scaling (SCALA)
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