X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.90 277 PEG 3350, ammonium sulfate, Tris, VAPOR DIFFUSION, temperature 277K, pH 7.90
Unit Cell:
a: 54.280 Å b: 53.480 Å c: 54.100 Å α: 60.36° β: 60.75° γ: 60.57°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.94 Solvent Content: 36.17
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.50 13.60 63072 3354 90.0 0.2 0.273 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.450 13.600 92.7 0.1 ? 8.6 ? ? 71506 ? 0.000 26.000
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.45 1.51 72.0 ? ? 1.6 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 0.98397,0.97938,0.97925, 0.97239 APS 17-ID
Software
Software Name Purpose Version
d*TREK data scaling .
SCALEPACK data scaling .
SHARP phasing .
TNT refinement .
d*TREK data reduction .