X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 298 Sodium Formate, Sodium Acetate, pH 4.6, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 123.894 Å b: 86.080 Å c: 42.867 Å α: 90.00° β: 90.10° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 3.1 Solvent Content: 60
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.84 37.27 34428 3841 98.23 0.20962 0.26073 25.499
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.84 40 99.4 0.083 ? 9.3 6.9 40217 38958 0.0 0.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.84 1.91 95.0 ? ? 2.3 5.0 3690
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9793, 0.9794, 0.954 APS 19-ID
Software
Software Name Purpose Version
REFMAC refinement 5.1.19
SBC-Collect data collection .
CrystalClear data reduction D*TRECK (MSC/RIGAKU)
HKL-2000 data scaling .
SOLVE phasing .