X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 278 Crystals of tetracenomycin F2 cyclase were grown by microbatch from a solution composed of 2.2 M (NH4)2SO4, 3 mg/ml protein, 50 mM HEPES pH 7.5 at 4 C (11). Large crystals were obtained by macroseeding with small crystals (0.06 mm x 0.08 mm) washed in macroseeding 1.4 M (NH4)2SO4, 50 mM HEPES pH 7.5 to slightly dissolve the crystal surfaces. After 3 to 4 weeks the crystals attained a size of 0.3 x 0.3 x 0.6 mm. Crystals of the selenomethionine labeled protein were obtained in a similar manner., Micro batch, temperature 278K
Unit Cell:
a: 46.7 Å b: 46.7 Å c: 188.3 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 65 2 2
Crystal Properties:
Matthew's Coefficient: 2.32 Solvent Content: 47
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD ? 1.9 30.00 9599 480 ? 0.199 0.245 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 30 92 0.027 ? 23.1 8.8 11605 11355 0.0 0.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.9 2.0 84 ? ? 5.4 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 273 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200 ? ? ?
Software
Software Name Purpose Version
Histar data collection .
XDS data reduction .
SOLVE phasing .
TNT refinement .
HISTAR data reduction .
XDS data scaling .
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