X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.6 298 PEG 600, sodium sulphate, HEPES, pH 7.6, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 134.848 Å b: 134.848 Å c: 156.365 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 4
Crystal Properties:
Matthew's Coefficient: 3.0 Solvent Content: 60.0
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 3.42 10.00 31393 1525 86.6 0.251 0.293 52.9
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.4 50.0 86.6 0.06 0.113 6.0 8 36461 31393 0.0 0.0 99.0
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.4 3.6 64.7 ? 0.249 1.9 8 3775
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 150 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9791, 0.9793, 0.9716 APS 19-ID
Software
Software Name Purpose Version
CNS refinement 1.1
HKL-2000 data reduction .
SCALEPACK data scaling .
SnB phasing .