X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.50 294 20% PEG 3000, 0.1 M HEPES, 0.2 M sodium acetate, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 294K, pH 7.50
Unit Cell:
a: 70.850 Å b: 70.850 Å c: 114.543 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 41 21 2
Crystal Properties:
Matthew's Coefficient: 2.3 Solvent Content: 50
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD - CHROMIUM SULFUR ANOMALOUS THROUGHOUT 1.90 59.76 21772 1182 96.86 0.21713 0.24907 29.484
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.900 59.760 96.9 0.072 0.072 20.0000 28.700 ? 21772 ? 0.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.90 1.97 95.6 ? 0.585 7.000 29.60 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X8C ? NSLS X8C
Software
Software Name Purpose Version
REFMAC refinement 5.2.0001
DENZO data reduction .
SCALEPACK data scaling .
SOLVE phasing .