X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 298.0 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| ROTATING ANODE | RIGAKU RU200 | ? | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| Xuong-Hamlin | data collection | Align |
| Xuong-Hamlin | data reduction | Scaling Suite |
| TNT | refinement | . |
| XUONG-HAMLIN | data scaling | (DETECTOR SYSTEM) |
| TNT | phasing | . |
