X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 291.00 COMPLEX WAS CRYSTALLIZED FROM 22.5% PEG 4000, 165 MM NACL, 35 MM SODIUM ACETATE, 3.2 MM DTT, 9.2% (VOL/VOL) GLYCEROL, 1.8 MM NAN3, 1.8 MM CADAVERINE-2HCL, 5.5 MM TRIS-HCL, PH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 291.00K
Unit Cell:
a: 64.180 Å b: 64.712 Å c: 78.035 Å α: 90.07° β: 92.98° γ: 102.95°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.80 Solvent Content: 70.0000
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIR THROUGHOUT 3.100 8.000 17014 497 81.400 0.3080000 0.3630000 65.00
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.000 25.000 77.400 0.1280000 0.0600000 ? 6.700 ? 19034 ? -3.000 39.70
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 113.00 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X12B ? NSLS X12B
Software
Software Name Purpose Version
CCP4 model building RAVE DM
X-PLOR refinement 3.851
DENZO data reduction .
SCALEPACK data scaling .
CCP4 phasing .
RAVE phasing .
DM phasing .