X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 9.5 297 PEG 8000, CHES, DTT, pH 9.5, VAPOR DIFFUSION, HANGING DROP, temperature 297K
Unit Cell:
a: 33.668 Å b: 44.448 Å c: 54.720 Å α: 75.87° β: 85.61° γ: 69.49°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1 Solvent Content: 51.1
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.90 52.70 20479 1095 95.06 0.21358 0.2492 43.951
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 52.71 ? ? ? ? ? ? 22129 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID29 0.97920, 0.979289, 0.891971 ESRF ID29
Software
Software Name Purpose Version
REFMAC refinement 5.1.24
MOSFLM data reduction .
CCP4 data scaling (SCALA)
SHARP phasing .
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