X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.2 ? HEPES, ammonium sulfate, isopropanol, sodium azide, pH 7.2, VAPOR DIFFUSION, HANGING DROP, SEEDING, temperature 100.0K
Unit Cell:
a: 85.395 Å b: 85.395 Å c: 145.7205 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 65 2 2
Crystal Properties:
Matthew's Coefficient: 2.97 Solvent Content: 58.3
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.60 50.00 40533 2037 96.2 0.169 0.198 29.427
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 50.0 96.2 ? 0.128 19.27 25.14 42126 40533 ? -3.00 28.98
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.60 1.65 99.7 ? 0.52 4.2 8.6 3644
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE SCHNEIDER 1.5418 ? ?
Software
Software Name Purpose Version
REFMAC refinement 5.1.25
XDS data reduction .
XSCALE data scaling .
SHELXD phasing .
SHELXE model building .