ISDA: 1STH

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	?	?	CRYSTAL SOAKED FOR NINE MONTHS AT 277 K IN STABILIZING BUFFER COMPRISING 40% (WW) MPD IN 30 MM TRIS-CL PH 8.15, 50 UM COCL2, 100 UM POTASSIUM CITRATE AND 50 UM PDTP. SOME EVAPORATION OCCURRED DURING THIS PERIOD, SO MPD CONCENTRATION AT TIME OF DATA COLLECTION, WHILE NOT KNOWN PRECISELY, WAS SUBSTANTIALLY GREATER THAN 40%.

Unit Cell:

a: 47.480 Å b: 47.480 Å c: 63.210 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: P 41

Crystal Properties:

Matthew's Coefficient: 2.11 Solvent Content: 41.82

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	?	?	1.85	6.0	11570	?	99.0	0.1740000	?	27.

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
?	?	99.	?	?	?	?	?	11600	?	0.0	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
		K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline

Software