X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.8 ? HANGING DROP CONTAINING: 8 MG/ML PROTEIN, 0.3% N-OCTYLTETRAOXYETHYLENE IN 50 MM SODIUM CITRATE, PH 4.8 WITH A RESERVOIR SOLUTION CONTAINING 100 MM SODIUM CITRATE, PH 4.8., vapor diffusion - hanging drop
Unit Cell:
a: 140.700 Å b: 140.700 Å c: 81.900 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 3 2 1
Crystal Properties:
Matthew's Coefficient: 3.3 Solvent Content: 63.
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MULTIPLE ISOMORPHOUS REPLACEMENT THROUGHOUT 2.85 20.0 18914 989 85.7 0.1670000 0.2430000 43.
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.85 20.0 86. ? 0.0560000 11.9 2.8 ? 18914 ? ? 30.
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.85 2.95 49. 0.3600000 2.0 1.6
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 293 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH2R ? ? ?
Software
Software Name Purpose Version
X-PLOR model building 3.851
X-PLOR refinement 3.851
XDS data reduction .
XSCALE data scaling .
CCP4 data scaling (AGROVATA)
X-PLOR phasing 3.851