X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 288 HANGING DROP WITH 9-11% PEG20000, 0.12 M SODIUM SULFATE AT PH8.0, EQUILIBRATED AGAINST PROTEIN FREE RESERVOIR WITH HIGHER PEG SOLUTION BY 2%. KEPT AT 15DEG., vapor diffusion - hanging drop, temperature 288K
Unit Cell:
a: 159.500 Å b: 159.500 Å c: 159.500 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 3
Crystal Properties:
Matthew's Coefficient: 3.2 Solvent Content: 61.
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 3.2 6. 18868 905 99.1 0.2220000 0.2990000 68.
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.2 50. 99.0 0.0750000 ? 8.9 4.6 ? 109106 ? ? 83.
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.2 3.37 98.1 ? ? 1.5 3.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 293 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-18B ? Photon Factory BL-18B
Software
Software Name Purpose Version
AMoRE phasing .
X-PLOR model building .
X-PLOR refinement .
DENZO data reduction .
CCP4 data scaling .
X-PLOR phasing .