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X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 291 Ammonium Sulfate, ammonium acetate, PEG 4000, NaCl, Tris, pH 5.0, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 110.650 Å b: 110.650 Å c: 47.450 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 62
Crystal Properties:
Matthew's Coefficient: 2.99 Solvent Content: 58.48
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.6 15 9704 490 98.89 0.2245 0.2695 58
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 20 98.7 0.043 ? 42 8.6 10225 10095 -1.5 -3.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.60 2.70 99.5 ? ? 9 9.7 1121
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 14-BM-D 0.9778, 0.9787, 0.9789 APS 14-BM-D
Software
Software Name Purpose Version
DENZO data reduction .
SCALEPACK data scaling .
SOLVE phasing .
REFMAC refinement 5.1
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