X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 100 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| SYNCHROTRON | ALS BEAMLINE 5.0.2 | 1.000 | ALS | 5.0.2 |
| Software Name | Purpose | Version |
|---|---|---|
| REFMAC | refinement | 5.1 |
| TRUNCATE | data reduction | . |
| AMoRE | phasing | . |
| X-PLOR | refinement | 5.1 |
| HKL-2000 | data collection | . |
| HKL-2000 | data reduction | . |
| CCP4 | data scaling | (TRUNCATE) |
