X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.2 291 32%PEG-8000, 0.1M Tris-HCl, 0.2M caesium chloride, pH 8.2, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 78.777 Å b: 37.665 Å c: 35.490 Å α: 90.00° β: 98.42° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 1.85 Solvent Content: 33.39
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.83 38.9 8426 495 96.91 0.17349 0.23947 10.834
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.83 38.9 ? 0.049 0.049 17.9 8 8923 8923 0. 0. ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.83 1.88 98.5 ? 0.096 13.3 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SRS BEAMLINE PX14.2 1.2, 0.9777,0.9793 SRS PX14.2
Software
Software Name Purpose Version
REFMAC refinement 5.0
DENZO data reduction .
CCP4 data scaling (SCALA)
SOLVE phasing .
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