ISDA: 1RO5

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.9	303	Ammonium Sulfate, Sodium Sulfate, MOPS, NaCl, pH 6.9, VAPOR DIFFUSION, HANGING DROP, temperature 303K

Unit Cell:

a: 154.900 Å b: 154.900 Å c: 154.900 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: F 2 3

Crystal Properties:

Matthew's Coefficient: 3.42 Solvent Content: 63.99

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SIRAS	THROUGHOUT	2.30	35.58	12210	1338	99.21	0.19712	0.23637	47.441

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.3	500	95	0.103	?	25.14	7.52	?	13180	0	-3	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.3	2.38	77	?	?	4	1.8	1067

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		95 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 19-ID	1.033	APS	19-ID

Software