X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.93 293 7.8% PEG-6000, 100 mM citrate, 120 mM ZnCl(2), 10 mM DTT, 3 mM NaN(3), pH 4.93, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 110.300 Å b: 96.900 Å c: 70.900 Å α: 90.00° β: 128.06° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.59 Solvent Content: 52.48
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.00 20.00 9964 1020 84.4 ? 0.354 11.8
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.999 20 96.77 0.061 ? 5.22 1.39 11870 11487 0.0 0.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.999 3.106 88.7 ? ? 2.03 1.20 1034
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 293 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200 1.54178 ? ?
Software
Software Name Purpose Version
CNX refinement 2002
X-GEN data reduction .
SAINT data scaling V. 4.050
X-PLOR phasing .