X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 ? 2 M NH4 SO4 0.1 M TRIS PH 8.5
Unit Cell:
a: 156.570 Å b: 156.570 Å c: 132.590 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: H 3 2
Crystal Properties:
Matthew's Coefficient: 3.14 Solvent Content: 58.
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIR WITH ANOMALOUS THROUGHOUT 2.50 8.00 19482 1000 92.8 0.2250000 0.2980000 23.0
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 30. 92.9 0.0710000 ? 25.4 13.4 ? 20345 ? 0.0 48.9
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.5 2.59 95.3 ? 8.7 11.
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE BW7A ? EMBL/DESY, HAMBURG BW7A
Software
Software Name Purpose Version
X-PLOR refinement 3.843
X-PLOR model building 3.843
SHELX refinement .
SHELX model building .
DENZO data reduction .
SCALEPACK data scaling .
SHELX phasing .
X-PLOR phasing 3.843
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