X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 110.0 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| ROTATING ANODE | RIGAKU RU300 | 0.9766, 0.9762, 0.9252 | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| REFMAC | refinement | 5.1.24 |
| XDS | data scaling | . |
| SOLVE | phasing | . |
| RESOLVE | phasing | . |
