X-RAY DIFFRACTION
Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
---|---|---|---|---|---|---|---|---|
1 | 293 K |
Source | Type | Wavelength List | Synchrotron Site | Beamline |
---|---|---|---|---|
ROTATING ANODE | SIEMENS | 0.71073 | ? | ? |
Software Name | Purpose | Version |
---|---|---|
Siemens | data collection | SMART |
SAINT | data reduction | & SADABS |
CNS | refinement | . |
SMART | data reduction | (SIEMENS) |
SAINT | data scaling | . |
SADABS | data scaling | . |
CNS | phasing | . |