X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.00 295.7 HANGING DROP, PEG 4000, SODIUM ACETATE, AMMONIUM ACETATE, TES, pH 6.00, VAPOR DIFFUSION, HANGING DROP, temperature 295.7K
Unit Cell:
a: 63.650 Å b: 63.650 Å c: 262.900 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 43 21 2
Crystal Properties:
Matthew's Coefficient: 2.04 Solvent Content: 39.7
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIR THROUGHOUT 2.50 20.0 19063 1883 97.0 0.2230000 0.3160000 28.5
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.500 37.500 98.2 0.0460000 ? 10.3000 3.400 ? 19281 ? ? 36.1
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.50 2.63 98.2 ? ? 9.8 3.50 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-6B ? Photon Factory BL-6B
Software
Software Name Purpose Version
SHARP phasing .
MLPHARE phasing .
X-PLOR refinement 98.1
DENZO data reduction .
CCP4 data scaling (SCALA)
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